Title | Simulation Study for the Higher Sensitivity of an Electron-Tracking Compton Camera at over 1 MeV |
Author | A. Takada, T. Tanimori, H. Kubo, K. Miuchi, S. Kabuki, J. D. Parker, Y. Kishimoto, T. Mizumoto, K, Ueno, S. Kurosawa, S. Iwaki, T. Sawano, K. Taniue, K. Nakamura, N. Higashi, Y. Matsuoka, S. Komura, Y. Sato |
Journal | Proceeding of 2011 IEEE Nuclear Science Symposium Conference Record |
category | proceedings |
Year | 2011 |
Volume | |
Page | 1215-1221 |
Theme | MeV |